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Efficiently testing large configuration spaces of Software Product Lines (SPLs) needs a sampling algorithm that is both scalable and provides good t-wise coverage. The 2019 SPLC Sampling Challenge provides large real-world feature models and asks for a t-wise sampling algorithm that can work for those models. We evaluated t-wise coverage by uniform sampling (US) the configurations of one of the provided feature models. US means that every (legal) configuration is equally likely to be selected. US yields statistically representative samples of a configuration space and can be used as a baseline to compare other sampling algorithms. We used existing algorithm called Smarch to uniformly sample SPL configurations. While uniform sampling alone was not enough to produce 100% 1-wise and 2-wise coverage, we used standard probabilistic analysis to explain our experimental results and to conjecture how uniform sampling may enhance the scalability of existing t-wise sampling algorithms.